The SEM-SRF and its staff have experience of all aspects of Electron Microscopy imaging and microstructural characterisation of multiple sample types across multiple scale ranges (mm to nm). Utilising complementary techniques to facilitate complete characterisation, enabling researchers to probe and find answers their research questions. Working with national and international researchers and industry in engineering, physical sciences, Earth and environmental sciences, and biosciences to provide in depth characterisation and targeted microanalysis of novel materials and processes.
Key Equipment: Zeiss Gemini 450 with OI Symmetry II EBSD detector, JEOL 7001F with OI Ultim-max EDS detector, Zeiss Axio Imager LM for CLEM
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