GEMS facility has two scanning electron microscopes, Zeiss Sigma VP and FEI Quanta environmental SEM, both equipped with FEG sources, as well as Renishaw Raman InVia microscope with 514 nm and 785 nm lasers. We are specialized in the material science research and have a track record working with geoscientists, chemists, engineers, physicists, art researchers and archaeologists. The facility offers a wide range of techniques, including imaging (SE, In-Lens, BSE and cathodoluminescence), elemental analysis by EDS (including standard-based quantification) and WDS (for high spectral resolution and trace elements) as well as crystallographic analysis by EBSD (including TKD).
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