The Microscopy Services Centre at Cranfield University combines a state of the art suite of equipment with a team of experienced technical specialists supporting a wide range of research and teaching activities. Our key equipment being a TESCAN S8215G, Focused Ion Beam Field Emission Scanning Electron Microscope (FIB-FESEM), a TESCAN Solaris X FIB-FESEM, with in-situ Time Of Flight Secondary Ion Mass Spectrometer detector (TOFSIMS). In addition to two Scanning Electron Microscopes: a TESCAN Vega 3, plus a TESCAN Vega 4, in addition to separate X-Ray Diffractometers and an Atomic Force Microscope.
Key contact name:
Diane Johnson
Key contact email address:
microscopyservices@cranfield.ac.uk
Website link:
https://www.cranfield.ac.uk/facilities/microscopy-services-and-facilities
Telephone number:
Social media links/handles:
https://uk.linkedin.com/showcase/cranfield-microscopy-services/